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【Seminar】Multi-Layer Risk Assessments in Intelligent Manufacturing Date: 12rd June, 2019

Published:2019-06-13

Date: 12rd June, 2019

Time: 9:30 a.m.

Venue: Room 1102, The Administration Building, Zhejiang University

 

【Speaker Introduction】:Professor Wei Jun, a tenured professor at the University of West Florida. Ph.D., Purdue University, USA, Master of Georgia Tech, and Master of Management, Zhejiang University. She is currently the chief editor of two international journals, including the “International Journal of Mobile Communications”, an SSCI search journal. The journal has more than 100 editorial boards from 26 countries around the world, including academic authorities and renowned scholars. And she served as the deputy editor or editor of six other international journals of SSCI/SCI.

 

【Lecture Abstract】:This talk mainly focuses on the theme of risk assessment in “intelligent manufacturing.”Specifically, it firstly identified risk factors in the context of emerging technological changes in intelligent manufacturing based on SCOR Theory.  Secondly, a hierarchical conceptual model was developed to assess these multi-layer risks in intelligent manufacturing.  Thirdly, hierarchical clustering analysis was conducted on valid data collected from 802 subjects in intelligent manufacturing companies to derive risk indices.  Fourthly, information entropy weight method was applied to derive risk weights for smart supply chain in intelligent manufacturing. The risk weights were further verified by simulation, and the results proved that the risk weights have certain practical efficiency. Finally, theoretical, practical and managerial implications are also presented.

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